The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Jul. 19, 2013
Nidek Co., Ltd., Gamagori, Aichi, JP;
NIDEK CO., LTD., Aichi, JP;
Abstract
An eyeglass frame shape measurement apparatus includes a measuring unit measuring shapes of right and left rims of an eyeglass frame. Measuring modes include a first measuring mode in which whole peripheries of both rims are measured; a second measuring mode in which the whole periphery of one of the right and left rims; and a third measuring mode in which nose side portions of the left rim and the nose side portion of the right rim are partially measured. A controller drives the measuring unit to measure the whole peripheries of both rims in the first measuring mode, for driving the measuring unit to measure the whole periphery of one of the left and right rims in the second mode, and drive the measuring unit to measure partially the nose side portions of both rims in the third mode.