The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Dec. 15, 2008
Applicants:

Gerhard Youssefi, Landshut, DE;

Rupert Veith, Pfarrkirchen, DE;

Inventors:

Gerhard Youssefi, Landshut, DE;

Rupert Veith, Pfarrkirchen, DE;

Assignee:

Bausch & Lomb Incorporated, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/15 (2006.01); A61F 9/008 (2006.01);
U.S. Cl.
CPC ...
A61B 3/152 (2013.01); A61F 9/008 (2013.01); A61F 2009/00872 (2013.01);
Abstract

An ophthalmic instrument for use with a subject's eye, comprising an interferometer having a test arm in which the subject's eye is to be positioned and a reference arm, the reference arm including a mirror adapted to be positioned such that the reference arm has a predetermined length, and an ophthalmic apparatus coupled to the interferometer such that, by altering a test arm length, a length between the ophthalmic apparatus and the eye is also altered. The mirror is positioned to achieve the predetermined length and a length of the test arm is adjusted such that interference between the light reflected from the eye and the light reflected from the mirror is achieved, the ophthalmic apparatus is optically aligned with the eye.


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