The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2015

Filed:

Jul. 13, 2012
Applicants:

Jae Hean Kim, Daejeon, KR;

Hyun Kang, Daejeon, KR;

Ji Hyung Lee, Daejeon, KR;

Bonki Koo, Daejeon, KR;

Inventors:

Jae Hean Kim, Daejeon, KR;

Hyun Kang, Daejeon, KR;

Ji Hyung Lee, Daejeon, KR;

Bonki Koo, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 17/00 (2006.01); H04N 17/02 (2006.01); G06K 9/00 (2006.01); H04N 5/247 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); G06T 7/002 (2013.01); H04N 5/247 (2013.01); G06T 2207/30244 (2013.01);
Abstract

A method for calibrating a camera network includes generating a projection matrix by each of cameras in respect of a calibration pattern that is disposed at a plurality of different positions in a photography zone. A portion of the projection matrix is produced as a sub-projection matrix. Sub-projection matrixes are arranged widthwise and lengthwise to generate one sub-measurement matrix. A singular value decomposition (SVD) is performed on the sub-measurement matrix to change the sub-measurement matrix into a matrix having a rank of 3 and a SVD is performed on the changed sub-measurement matrix. A rotation value of the calibration pattern, and an internal parameter and a rotation value of each camera are extracted to thereby calibrate the camera network.


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