The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
Nov. 25, 2011
Shunsuke Suzuki, Kanagawa, JP;
Atsuo Fujimaki, Tokyo, JP;
Shunsuke Suzuki, Kanagawa, JP;
Atsuo Fujimaki, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Abstract
The present invention provides a 3D data analysis apparatus and a 3D data analysis method. A 3D data analysis apparatus including a data storage unit that stores measurement data of microparticles, an input unit that selects three kinds of variables independent of the measurement data, a data processing unit that calculates positions and graphics in a coordinate space with the three kinds of variables being coordinate axes and creates a 3D stereoscopic image that represents a characteristic distribution of the microparticles, and a display unit that displays the 3D stereoscopic image, and the 3D data analysis apparatus variably sets a separate area in the coordinate space on the basis of an input signal from the input unit and displays the area in the 3D stereoscopic image.