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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9185316 B1

PDFFull Text
Date of Patent:
Nov. 10, 2015

Filed:

Nov. 30, 2011

Data sampler, data sampling method, and photo detecting apparatus including data sampler that minimizes the effect of offset

Applicants:

Jin Min Cheon, Yongin-si, KR;

Dong Hun Lee, Yongin-si, KR;

Young Kyun Jeong, Hwaseong-si, KR;

Yun Jung Kim, Yongin-si, KR;

Seog Heon Ham, Suwon-si, KR;

Jin Ho Seo, Seoul, KR;

Shuichi Shimokawa, Suwon-si, KR;

Inventors:

Jin Min Cheon, Yongin-si, KR;

Dong Hun Lee, Yongin-si, KR;

Young Kyun Jeong, Hwaseong-si, KR;

Yun Jung Kim, Yongin-si, KR;

Seog Heon Ham, Suwon-si, KR;

Jin Ho Seo, Seoul, KR;

Shuichi Shimokawa, Suwon-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:

Volentine & Whitt, PLLC

Primary Examiner:

Que T Le

Assistant Examiner:

Jennifer Bennett

Int. Cl.
CPC ...
H01J 40/14 (2006.01); H01L 27/00 (2006.01); H03K 17/78 (2006.01); H04N 5/361 (2011.01); H04N 5/365 (2011.01); H04N 5/378 (2011.01);
U.S. Cl.
CPC ...
H04N 5/361 (2013.01); H04N 5/3653 (2013.01); H04N 5/378 (2013.01);
Abstract

A data sampler and a photo detecting apparatus compensate a reference signal with offset information measured from a unit pixel, and compare an offset-compensated reference signal with a data signal, thereby minimizing the impact of an offset occurring with an increase of gain in the data sampler.

Find Patent Forward Citations

Quick Actions:

Cheon, Jin. (2015). Data sampler, data sampling method, and photo detecting apparatus including data sampler that minimizes the effect of offset (U.S. Patent No. 9185316). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9185316

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