The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2015

Filed:

Mar. 13, 2013
Applicant:

Lg Electronics Inc., Seoul, KR;

Inventors:

Minwoo Kim, Seoul, KR;

Jungyong Lee, Seoul, KR;

Assignee:

LG ELECTRONICS INC., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G06K 9/20 (2006.01); H04N 1/387 (2006.01); G06K 9/34 (2006.01); H04N 1/00 (2006.01); H04N 1/107 (2006.01); H04N 1/195 (2006.01); H04N 101/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/3876 (2013.01); G06K 9/342 (2013.01); H04N 1/00241 (2013.01); H04N 1/107 (2013.01); H04N 1/19568 (2013.01); G06K 2009/2045 (2013.01); H04N 1/00307 (2013.01); H04N 2101/00 (2013.01); H04N 2201/0041 (2013.01); H04N 2201/0049 (2013.01); H04N 2201/0055 (2013.01); H04N 2201/0081 (2013.01);
Abstract

Provided are an input device and an image processing method thereof. The image processing method of the input device having a scan function includes acquiring a first image frame and a second image frame to detect coordinates of the acquired first image frame and coordinates of the acquired second image frame; dividing an overlap region between the first image frame and the second image frame into a plurality of sub overlap regions by using the detected coordinates of the first and second image frames; dividing each of the sub overlap regions into unit regions; setting a reference feature point of a plurality of feature points within the divided unit regions; and extracting corresponding points by using the set reference feature point.


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