The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
Feb. 11, 2014
Keiji Kojima, Kanagawa, JP;
Hiroyoshi Ishizaki, Kanagawa, JP;
Keiji Kojima, Kanagawa, JP;
Hiroyoshi Ishizaki, Kanagawa, JP;
RICOH COMPANY, LIMITED, Tokyo, JP;
Abstract
An image test apparatus includes an image generating unit acquiring an output target image with which an image is formed and output by an image forming apparatus, and generating a test image for testing the read image, an image test unit determining a defect of the read image based on a difference between the test image and the read image, a defect number determining unit determining number of defects contained in the read image based on a determination result of the defect of the read image, a frequency distribution generating unit accumulating defect numbers of multiple read images, each of the defect numbers being the number of defects detected in one read image, and generating a frequency distribution of the defect numbers, and an abnormality determination unit determining an abnormality of the image forming apparatus based on a change in the frequency distribution generated for each predetermined period.