The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2015

Filed:

Feb. 08, 2013
Applicant:

Thomson Licensing, Issy de Moulineaux, FR;

Inventors:

Marco Winter, Hannover, DE;

Dirk Gandolph, Hannover, DE;

Assignee:

Thomson Licensing, Issy les Moulineaux, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/00 (2006.01); G06T 15/04 (2011.01); H04N 19/597 (2014.01); H04N 19/85 (2014.01);
U.S. Cl.
CPC ...
G06T 15/04 (2013.01); H04N 13/0018 (2013.01); H04N 19/597 (2013.01); H04N 19/85 (2013.01);
Abstract

A method and an apparatus for applying film grain to stereoscopic or multi-view images or sequences of stereoscopic or multi-view images are described. After retrieving an image pair or a set of multi-view images a depth map for the image pair or the set of multi-view images and a confidence map for the depth map are obtained. Film grain is then applied to non-occluded areas of the images in accordance with depth values of the depth map and confidence values of the confidence map. Occluded areas of the images are processed separately by first deriving depth values for these areas and then applying film grain to these areas in accordance with the derived depth values.


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