The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
Aug. 10, 2011
Poornima Hanumara, Boise, ID (US);
David Sherman, Boise, ID (US);
Wade Dorrell, Boise, ID (US);
Elaine Andersen, Boise, ID (US);
Julius Ravago, Eagle, ID (US);
Robert Kaiser, Boise, ID (US);
Poornima Hanumara, Boise, ID (US);
David Sherman, Boise, ID (US);
Wade Dorrell, Boise, ID (US);
Elaine Andersen, Boise, ID (US);
Julius Ravago, Eagle, ID (US);
Robert Kaiser, Boise, ID (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Automatic trend analysis is provided on a dataset. Upon selection of a data cell or chart point within a data representation, a trend chart is automatically generated in order to demonstrate how the data within the selection trends over time. The system may automatically configure the trend chart based on the metadata of a data source associated with a selected data such that no input or configuration is needed by a user. The system may identify the time hierarchies and other data attributes included in the metadata of the data source associated with a selected data cell and may automatically configure the axis settings and the trend lines according to metadata of the data source. The trend chart may also be configured to display multiple trend lines for comparing multiple data set trends over a specified time period.