The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
Mar. 12, 2013
Qualcomm Incorporated, San Diego, CA (US);
Pawan Kumar Baheti, Bangalore, IN;
Kishor K. Barman, Bangalore, IN;
Dhananjay Ashok Gore, Bangalore, IN;
Senthilkumar Sundaram, Bangalore, IN;
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
An attribute is computed based on pixel intensities in an image of the real world, and thereafter used to identify at least one input for processing the image to identify at least a first maximally stable extremal region (MSER) therein. The at least one input is one of (A) a parameter used in MSER processing or (B) a portion of the image to be subject to MSER processing. The attribute may be a variance of pixel intensities, or computed from a histogram of pixel intensities. The attribute may be used with a look-up table, to identify parameter(s) used in MSER processing. The attribute may be a stroke width of a second MSER of a subsampled version of the image. The attribute may be used in checking whether a portion of the image satisfies a predetermined test, and if so including the portion in a region to be subject to MSER processing.