The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9183275 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 10, 2015

Filed:

Jan. 17, 2008
Applicants:

Honglei Guo, Beijing, CN;

Zhi LI Guo, Beijing, CN;

Zhong Su, Beijing, CN;

Inventors:

HongLei Guo, Beijing, CN;

Zhi Li Guo, Beijing, CN;

Zhong Su, Beijing, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 17/27 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30616 (2013.01); G06F 17/277 (2013.01);
Abstract

A data profiling method and system for reading an input data entry set and labeling semantic fragments according to fragments of data entries and semantic features of fragments and, based on the labeled semantic fragments performing a semantic-level data analysis of the input data entry set to obtain analysis results. According to the method and system of the present invention, it is able to obtain better data analysis of free text and make corresponding statistics and analysis of free-text data entry sets according to semantics.


Find Patent Forward Citations

Guo, HongLei. (2015). Data profiling method and system (U.S. Patent No. 9183275). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9183275

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…