The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
May. 09, 2013
Applicants:
Vahit Hakan Hacigumus, San Jose, CA (US);
Jagan Sankaranarayanan, Santa Clara, CA (US);
Jeffrey Lefevre, Santa Cruz, CA (US);
Junichi Tatemura, Cupertino, CA (US);
Neoklis Polyzotis, Cupertino, CA (US);
Inventors:
Vahit Hakan Hacigumus, San Jose, CA (US);
Jagan Sankaranarayanan, Santa Clara, CA (US);
Jeffrey LeFevre, Santa Cruz, CA (US);
Junichi Tatemura, Cupertino, CA (US);
Neoklis Polyzotis, Cupertino, CA (US);
Assignee:
NEC Laboratories America, Inc., Princeton, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30448 (2013.01); G06F 17/30457 (2013.01); G06F 17/30463 (2013.01); G06F 17/30471 (2013.01);
Abstract
A system for evolutionary analytics supports three dimensions (analytical workflows, the users, and the data) by rewriting workflows to be more efficient by using answers materialized as part of previous workflow execution runs in the system.