The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2015

Filed:

Dec. 20, 2012
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Guangxin Yang, Beijing, CN;

Yi Ren, Beijing, CN;

Jianwang Ao, Beijing, CN;

Caleb E. Welton, Foster City, CA (US);

Assignee:

EMC CORPORATION, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30008 (2013.01);
Abstract

A method, article of manufacture, and apparatus for process data. In some embodiments, this includes receiving a desired sample size from a user, increasing the desired sample size based on a policy, using the increased desired sample size to determine a number of samples to take from a database segment, wherein the database segment includes a portion of a dataset, generating a sub-dataset based on the determined number of samples to take from the database segment, wherein the sub-dataset only includes identifiers, joining the generated sub-dataset with the dataset, and storing the joined dataset in a storage device.


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