The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
Mar. 02, 2010
Applicants:
Wen-tau Yih, Redmond, WA (US);
Christopher A. Meek, Kirkland, WA (US);
Hannaneh Hajishirzi, Urbana, IL (US);
Inventors:
Wen-tau Yih, Redmond, WA (US);
Christopher A. Meek, Kirkland, WA (US);
Hannaneh Hajishirzi, Urbana, IL (US);
Assignee:
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 15/18 (2013.01); G06F 17/30 (2013.01);
Abstract
Described is a technology for measuring the similarity between two objects (e.g., documents), via a framework that learns the term-weighting function from training data, e.g., labeled pairs of objects, to develop a learned model. A learning procedure tunes the model parameters by minimizing a defined loss function of the similarity score. Also described is using the learning procedure and learned model to detect near duplicate documents.