The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2015

Filed:

Dec. 06, 2012
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

En-Tzu Wang, Hsinchu, TW;

Tzi-Cker Chiueh, Taipei, TW;

Je-Jone Ko, Hsinchu, TW;

Shu-Chun Yeh, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2006.01); G06F 9/46 (2006.01); G06F 11/00 (2006.01); G06F 15/173 (2006.01);
U.S. Cl.
CPC ...
G06F 9/45558 (2013.01); G06F 2009/45591 (2013.01);
Abstract

According to one exemplary embodiment, a method for analyzing root causes applies an application-level dependency discovery and anomaly detection to find application-level dependencies in one or more virtual machines (VMs), and generate an application-level topology with anomaly, and then transfers the application-level topology with anomaly to a VM-level dependency, and transfers the VM-level dependency to a physical machine level (PM-level) dependency via a physical and virtual resource mapping, and eventually generates a group of event sets. A prioritized event list is generated by prioritizing the group of event sets.


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