The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
Aug. 29, 2012
Applicants:
Makoto Ichida, Yokohama, JP;
Hiroshi Sukegawa, Tokyo, JP;
Naohiro Matsukawa, Yokohama, JP;
Inventors:
Assignee:
KABUSHIKI KAISHA TOSHIBA, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 1/20 (2006.01); G11C 7/04 (2006.01); G11C 16/06 (2006.01); G06F 9/44 (2006.01); H01L 21/324 (2006.01); H01L 23/38 (2006.01); G06F 3/06 (2006.01); H01L 23/34 (2006.01);
U.S. Cl.
CPC ...
G06F 9/4421 (2013.01); G06F 11/3034 (2013.01); G06F 11/3058 (2013.01); G11C 7/04 (2013.01); G11C 16/06 (2013.01); G06F 1/20 (2013.01); G06F 1/206 (2013.01); G06F 3/0679 (2013.01); H01L 21/324 (2013.01); H01L 23/34 (2013.01); H01L 23/38 (2013.01);
Abstract
According to one embodiment, a memory system includes a nonvolatile semiconductor storage able to hold data, a temperature measurement section configured to measure the temperature of the semiconductor storage, a temperature varying section configured to change the temperature of the semiconductor storage, and a control circuit including a transmitter configured such that data received from a host is transferred to the semiconductor storage, and a temperature storage configured to store temperature information received from the temperature measurement section.