The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2015

Filed:

Feb. 25, 2014
Applicant:

Olympus Corporation, Tokyo, JP;

Inventors:

Tsutomu Uzawa, Saitama, JP;

Tsutomu Sasamoto, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 23/24 (2006.01); G02B 15/02 (2006.01); G02B 15/10 (2006.01); A61B 1/00 (2006.01);
U.S. Cl.
CPC ...
G02B 23/243 (2013.01); A61B 1/0011 (2013.01); A61B 1/00096 (2013.01); A61B 1/00188 (2013.01); G02B 15/02 (2013.01); G02B 15/10 (2013.01);
Abstract

An object is to provide an endoscope objective lens in which the aberrations are less susceptible to manufacturing errors and in which the variation in field curvature caused by focusing is small. There is provided an endoscope objective lens including: in sequence from an object side, a front group having negative refractive power, an aperture stop, and a rear group having positive refractive power; and a focusing lens that has a negative refractive power and that can be inserted into an optical path between the front group and the rear group. The focusing lens is inserted into the optical path in a normal observation state and is retracted from the optical path in a short-distance observation state, in which the working distance is smaller than that in the normal observation state.


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