The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2015

Filed:

Aug. 30, 2013
Applicant:

Checkpoint Technologies, Llc., San Jose, CA (US);

Inventors:

Thomas E Clawges, Pleasanton, CA (US);

David J Morgan, Boulder Creek, CA (US);

Guoqing Xiao, Saratoga, CA (US);

Assignee:

CheckPoint Technologies, LLC, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/24 (2006.01); G02B 21/22 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0016 (2013.01);
Abstract

An optical probe system includes a sample plate for holding a target device comprising an integrated circuit, and a rotational stage that includes a plurality of ports configured to receive and hold a plurality of optical objective systems that can collect reflected or emitted light from the integrated circuit. At least one of the ports includes a centering plate mounted on the rotational stage and configured to conduct a translational movement on the rotational stage. The port also includes a gimbal plate mounted on the centering plate and that can be tilted relative to the centering plate. A first optical objective system that is mounted on the gimbal plate can be centered by the center plate and aligned by the gimbal plate.


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