The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
Jul. 29, 2011
John Peter Godbaz, Hamilton, NZ;
Adrian Andrew Dorrington, Hamilton, NZ;
Michael John Cree, Hamilton, NZ;
John Peter Godbaz, Hamilton, NZ;
Adrian Andrew Dorrington, Hamilton, NZ;
Michael John Cree, Hamilton, NZ;
Waikatolink Ltd, Hamilton, NZ;
Abstract
An apparatus for measuring intensity and/or range characteristics of an object(s), comprising: a signal source to emit modulation signals at a frequency(s); an illuminator to illuminate the object(s) by a first modulation signal; a sensor comprising a pixel(s), wherein the sensor creates a sampled correlated signal by sampling the correlation of a backscattered signal with a second modulation signal within the pixel; and a processor to determine range/intensity characteristics of component returns within the pixel(s) by comparing sampled correlated signals using measurements(s), wherein the measurement(s) comprise first and second modulation signals having a characteristic(s) selected from: (a) two or more different modulation frequencies, (b) a different modulation frequency(s) and an offset of the correlation waveform, and (c) another different modulation frequency(s) and one selected from: the zeroth spatial frequency of the signal returns versus range and an approximation of the zeroth spatial frequency of the signal returns versus range.