The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9182435 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 10, 2015

Filed:

Sep. 28, 2012
Applicants:

Jeffrey M Snow, Bloomington, IN (US);

Michael Schumm, Bloomington, IN (US);

William L Shaff, Bedford, IN (US);

Terry Carlson, Washington, IN (US);

Carl Baker, Avoca, IN (US);

Inventors:

Jeffrey M Snow, Bloomington, IN (US);

Michael Schumm, Bloomington, IN (US);

William L Shaff, Bedford, IN (US);

Terry Carlson, Washington, IN (US);

Carl Baker, Avoca, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01);
Abstract

A method and software implementation for spatial pattern analysis. A user-guided test procedure is implemented to measure features of an antenna under test to determine the antenna's far-field patterns. The antenna features include RF amplitude or phase, and position and orientation relative to a receiving object.


Find Patent Forward Citations

Snow, Jeffrey. (2015). Method and software for spatial pattern analysis (U.S. Patent No. 9182435). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9182435

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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