The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2015

Filed:

Oct. 15, 2010
Applicant:

Mitsuhiko Sano, Tokyo, JP;

Inventor:

Mitsuhiko Sano, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/00 (2006.01); G01N 29/24 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 29/00 (2013.01); G01N 29/2418 (2013.01); G01N 21/1702 (2013.01); G01N 2291/0234 (2013.01); G01N 2291/0289 (2013.01);
Abstract

A pulse laser oscillator () outputs a first laser beam, a beam splitter splitting the first laser beam into split beams, optical paths () propagating light of split beams split, respectively, taking different times for light propagation thereof, a condenser superimposing light of split beams propagated through the optical paths, respectively, on an identical spot of a measuring material (), for irradiation therewith, a laser interferometer () irradiating the measuring material () with light of a second laser beam, having light intensity variations resulted from interferences between reference light and light of the second laser beam reflected or scattered, as bases to detect ultrasonic waves energized by light of the first laser beam and transmitted in the measuring material (), a waveform analyzer () calculating a metallic microstructure or a material property of the measuring material () based on ultrasonic waves.


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