The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
Jul. 22, 2013
Sebastien Tixier, North Vancouver, CA;
Michael Kon Yew Hughes, Vancouver, CA;
Sebastien Tixier, North Vancouver, CA;
Michael Kon Yew Hughes, Vancouver, CA;
Honeywell ASCA Inc., Mississauga, CA;
Abstract
Microwave techniques for measuring moisture and other properties of paper and related products without requiring an independent measurement of temperature are provided. A sensor directly measures the reflection or transmission of microwaves at a number of well-chosen frequencies so as to characterize the absorption spectrum of the product. The technique of measuring the parameters of a composition includes: (a) directing incident microwave radiation over a spectrum of wavelengths from an antenna upon the composition; (b) measuring the microwave radiation over the spectrum of wavelengths that emerges from the composition; (c) determining the reflected and/or transmitted transfer function; and (d) relating the transfer function of the composition to the parameters of the composition by applying a theoretic, calibrated, or hybrid model. The product moisture and temperature are extracted from the transfer function.