The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
Mar. 10, 2014
Applicant:
Olympus Corporation, Tokyo, JP;
Inventor:
Ryosuke Ito, Hino, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/17 (2006.01); A61B 1/00 (2006.01); G01N 21/27 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/17 (2013.01); A61B 1/00057 (2013.01); A61B 1/00165 (2013.01); A61B 5/0075 (2013.01); G01N 21/274 (2013.01); A61B 2560/0238 (2013.01);
Abstract
A calibration apparatus includes an insertion portion into which a measurement probe is inserted and a reference reflection plate that is arranged at a position away from a distal end of the measurement probe by a predetermined distance in a state in which the measurement probe has been inserted in the insertion portion and that has uniform reflectivity of light in a range of a wavelength to be measured in an irradiation plane of an illumination light, wherein a material forming the reference reflection plate has a scattering mean free path that is greater than a spatial coherence length at the predetermined distance.