The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2015

Filed:

Mar. 12, 2012
Applicants:

Harrison Barrett, Tucson, AZ (US);

Luca Caucci, Tucson, AZ (US);

Lars Furenlid, Tucson, AZ (US);

Akinori Ohkubo, Utsunomiya, JP;

Inventors:

Harrison Barrett, Tucson, AZ (US);

Luca Caucci, Tucson, AZ (US);

Lars Furenlid, Tucson, AZ (US);

Akinori Ohkubo, Utsunomiya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/20 (2006.01); G01J 9/00 (2006.01);
U.S. Cl.
CPC ...
G01J 9/00 (2013.01);
Abstract

An apparatus for estimating a wavefront parameter includes a light source, a lenslet array, a detector for detecting light generated by the light source and passed through the lenslet array, a wavefront corrective element disposed between the lenslet array and the light source; and a data analyzer configured to estimate at least one wavefront parameter at a plane located on the light source side of the corrective element. The lenslet array and the sensor array are arranged to form a wavefront sensor, and the wavefront corrective element is configured to correct an aberration of the wavefront.


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