The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2015

Filed:

Apr. 03, 2014
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

Ian S. Robinson, Redondo Beach, CA (US);

John D. Bloomer, Redondo Beach, CA (US);

Assignee:

RAYTHEON COMPANY, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/45 (2006.01); G01J 3/28 (2006.01); G01J 3/453 (2006.01); G01J 3/02 (2006.01); G01J 3/12 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/0224 (2013.01); G01J 3/4531 (2013.01); G01J 2003/1291 (2013.01);
Abstract

An imaging interferometric transform spectropolarimeter configured to simultaneously collect four polarizations. In one example, an spectropolarimeter includes a dual-beam interferometric transform spectrometer configured to receive electromagnetic radiation from a viewed scene, and including first and second focal plane arrays that are spatially registered with one another, a first polarizer coupled to the first focal plane array and configured to transmit only a first pair of polarizations to the first focal plane array, and a second polarizer coupled to the second focal plane array and configured to transmit only a second pair of polarizations to the second focal plane array, the second pair of polarizations being different than the first pair of polarizations.


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