The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2015

Filed:

Aug. 08, 2014
Applicant:

Thermo Scientific Portable Analytical Instruments Inc., Tewksbury, MA (US);

Inventors:

Craig M. Gardner, Belmont, MA (US);

Michael Burka, Winchester, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0297 (2013.01); G01N 21/35 (2013.01); G01N 2021/3595 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/1242 (2013.01);
Abstract

Featured is a method for reducing frequency of taking background spectra in FTIR or FTIR-ATR spectroscopy. Such a method includes determining if there is a pre-existing reference spectrum available and if such a reference spectrum is available, acquiring a present reference scan before acquiring a sample scan. The method also includes comparing the present reference scan with the pre-existing reference spectrum to determine if there is one or more non-conformities therebetween and if there is/are one or more nonconformities, determining if the one or more non-conformities are resolvable or not. If the one or more non-conformities are resolvable; resolve each non-conformity in a determined manner and thereafter acquiring a scan of the sample, and if the non-conformities are not resolvable, then acquiring a new reference sample and thereafter acquiring a scan of the sample.


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