The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
Dec. 18, 2014
Applicant:
Kemira Oyj, Helsinki, FI;
Inventors:
Vladimir Grigoriev, Atlanta, GA (US);
Danny Nguyen, Norcross, GA (US);
Scott Rosencrance, Douglasville, GA (US);
Chen Lu, Marietta, GA (US);
Assignee:
KEMIRA OYJ, Helsinki, FI;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01H 13/00 (2006.01); G01N 29/036 (2006.01);
U.S. Cl.
CPC ...
G01H 13/00 (2013.01); G01N 29/036 (2013.01); G01N 2291/0237 (2013.01); G01N 2291/0426 (2013.01);
Abstract
Described herein are quartz crystal microbalance (QCM) and quartz crystal microbalance with dissipation (QCMD) techniques that can be used for measuring characteristics of a creping adhesive film similar to the creping adhesive film that is formed on a Yankee dryer during the tissue and towel manufacturing process. In addition, exemplary embodiments described herein may use these techniques to predict performance of creping aids utilized to form a creping adhesive film.