The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2015

Filed:

Nov. 05, 2010
Applicants:

Ivar Lokken, Tiller, NO;

Christian Hergot, Tiller, NO;

Inventors:

Ivar Lokken, Tiller, NO;

Christian Hergot, Tiller, NO;

Assignee:

HITTITE MICROWAVE CORPORATION, Chelmsford, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G01D 3/028 (2006.01); G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
G01D 3/028 (2013.01); G01D 18/008 (2013.01); H01L 2924/0002 (2013.01);
Abstract

A resistive sensor read-out apparatus is disclosed. In one embodiment, the resistive sensor read-out apparatus comprises an active sensor, a reference element, a bias circuit, a current-to-voltage converter, an analog-to-digital converter and a calibration processor. The bias circuit is coupled to the active sensor and the reference element and configured to calibrate one or more mismatches between the active sensor and the reference element. The current-to-voltage converter is coupled to an output of the bias circuit. The analog-to-digital converter is coupled to an output of the current-to-voltage converter. The calibration processor is coupled to an output of the analog-to-digital converter and configured to estimate an error caused by limited resolution mismatch calibration. The calibration processor is also configured to at least partially control calibration performed at the bias circuit based on the error.


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