The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
Dec. 04, 2012
Honeywell International Inc., Morristown, NJ (US);
Ralph R. Jones, Coon Rapids, MN (US);
Douglas Mark Weed, Forest Lake, MN (US);
David Robert Storch, Springfield, OH (US);
Honeywell International Inc., Morristown, NJ (US);
Abstract
A calibration method comprises providing a mounting fixture including a tray coupled to a frame, and an alignment measurement sensor removably coupled to the tray. An angular orientation of the tray is determined using the alignment measurement sensor removably coupled to the tray in a first position. The alignment measurement sensor is then moved to a second position on the tray that is rotated from the first position, and the angular orientation of the tray is determined using the alignment measurement sensor at the second position. An axis misalignment for at least two of a pitch axis, a roll axis, or a yaw axis of the alignment measurement sensor is then calculated to determine one or more misalignment factors. The one or more misalignment factors are then applied to correct for misalignment of the alignment measurement sensor.