The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
Sep. 12, 2014
Mikel John Stanich, Longmont, CO (US);
Kartheek Chandu, Longmont, CO (US);
Larry M. Ernst, Longmont, CO (US);
Mikel John Stanich, Longmont, CO (US);
Kartheek Chandu, Longmont, CO (US);
Larry M. Ernst, Longmont, CO (US);
Ricoh Company, LTD., Tokyo, JP;
Abstract
A method is described that entails printing a series of test patterns. Each test pattern has its own respective set of outer lines and set of inner lines. The series of test patterns have a different intended spacing between their respective inner lines and outer lines. The intended spacing of each test pattern is printed in a manner that correlates the intended spacing of each test pattern with its test pattern. Each of the outer lines are printed with a first print source and each of the inner lines printed with a second print source. Inner lines of a first set of the test patterns are shorter than inner lines of a second set of the test patterns to enhance resolution at which differences in the spacings between respective inner and outer lines of same test patterns are able to be detected across different test patterns.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile