The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2015

Filed:

Mar. 26, 2014
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Atsushi Nagahara, Azumino, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 2/01 (2006.01); B41J 3/407 (2006.01); B41J 11/66 (2006.01);
U.S. Cl.
CPC ...
B41J 3/4075 (2013.01); B41J 11/663 (2013.01);
Abstract

A label production apparatus includes a printing unit that prints a image onto a medium that includes a first base material, a second base material, and an adhesive layer between the first base material and the second base material; an inspection unit that inspects the image printed onto the medium; and a post-processing unit that cuts the first base material based on an inspection result from the inspection unit, the post-processing unit cutting the first base material using a first cut line that separates an area where the image is formed from the first base material in the case where a print defect has not been detected in the image, and cutting the first base material using a second cut line in which part of the first cut line is not cut in the case where a print defect has been detected in the image.


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