The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
May. 09, 2012
Haruo Nakaji, Boston, MA (US);
Hidenao Fukuyama, Kyoto, JP;
Yuusuke Iso, Kyoto, JP;
Shinichi Urayama, Kyoto, JP;
Naoya Oishi, Kyoto, JP;
Hiroshi Fujiwara, Kyoto, JP;
Haruo Nakaji, Boston, MA (US);
Hidenao Fukuyama, Kyoto, JP;
Yuusuke Iso, Kyoto, JP;
Shinichi Urayama, Kyoto, JP;
Naoya Oishi, Kyoto, JP;
Hiroshi Fujiwara, Kyoto, JP;
Sumitomo Electric Industries, Ltd., Osaka-shi, JP;
Kyoto University, Kyoto-shi, JP;
Abstract
An optical tomography deviceis provided as one capable of obtaining tomographic information of a measuring object with higher accuracy. In the optical tomography device, numerical apertures of reception fibersare different from each other. Therefore, the device has a configuration wherein the reception fibersreceive two kinds of respective light beams with different solid angle distributions, whereby the device can also obtain angular information, in addition to intensity information of light emerging from a measuring object. As a result, the accuracy is enhanced for an analysis about the tomographic information of the measuring object.