The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
May. 10, 2013
Carl Zeiss Meditec Ag, Jena, DE;
Thomas Mohr, Jena, DE;
Elke Machalett, Jena, DE;
Martin Hacker, Jena, DE;
Martin Kühner, Bad Klosterlausnitz, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A method for Determining at Least One Parameter for Diagnosis or Risk Assessment of a Disease, including AMD. The distribution of the macular pigment MP of an eye and at least one area A whose bordering line corresponds to a constant optical density MPD and/or concentration MPC of MP is determined by an analysis unit. The bordering line is subjected to a quantitative shape description. At least one parameter DP, suitable for diagnosing a disease and/or the risk of a disease is derived from the quantitative shape description of the bordering line of the areas A. The method is provided for diagnosis or risk assessment but may also be used in the context of treatment of macular pigment deficiency phenomena to select the required supplements. This method, based on the determination of the fractal dimension, is also suitable for diagnosing other diseases such as edemas, actinomycoses, atrophies or lesions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile