The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
Mar. 15, 2013
Applicant:
Optovue, Inc., Fremont, CA (US);
Inventor:
Michael Hee, Burlingame, CA (US);
Assignee:
Optovue, Inc., Fremont, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/00 (2006.01); A61B 3/10 (2006.01); A61B 3/107 (2006.01);
U.S. Cl.
CPC ...
A61B 3/107 (2013.01); A61B 3/102 (2013.01);
Abstract
A method of measurement is presented. A method of measurement according to some embodiments of the present invention includes obtaining a first measurement from a first imaging method; obtaining a second measurement from a second imaging method; combining the first and the second measurement to obtain a structural information and an image representation of a structure of an eye; calculating at least one shape parameter from the structural information; and displaying the image representation of the structure of the eye.