The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9179533 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 03, 2015

Filed:

Sep. 14, 2011
Applicants:

Lester D. Miller, Hudson, OH (US);

Jaisingh Udaysingh Rajwade, Highland Heights, OH (US);

Inventors:

Lester D. Miller, Hudson, OH (US);

Jaisingh Udaysingh Rajwade, Highland Heights, OH (US);

Assignee:

Koninklijke Philips N. V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G 1/26 (2006.01); A61B 6/03 (2006.01); G06T 11/00 (2006.01); G06F 17/00 (2006.01); H05G 1/54 (2006.01);
U.S. Cl.
CPC ...
H05G 1/265 (2013.01); A61B 6/032 (2013.01); G06F 17/00 (2013.01); G06T 11/005 (2013.01); H05G 1/54 (2013.01);
Abstract

A method includes identifying projection data generated during an x-ray tube arc event, determining x-ray tube voltages for data points of the identified projection data, correcting the identified data points based on the determined x-ray tube voltages for the data points, and reconstructing projection data that includes projection data generated during non x-ray tube arc events and the corrected projection data, and a system includes a projection data processor () that corrects projection data corresponding to data acquired during an x-ray tube arc event.


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