The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2015
Filed:
Oct. 17, 2012
Qualcomm Incorporated, San Diego, CA (US);
Sachin D Dasnurkar, San Diego, CA (US);
Prasannakumar Seeram, San Marcos, CA (US);
Prasad Rajeevalochanam Bhadri, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
A method and apparatus for optimizing the yield of tested electronics devices is provided. A sample device is characterized to derive a specification for each device in the group. The sample size is chosen to provide reliable data and to minimize the effect of outlier devices on the characterization. After characterization, boundaries are set for the group of tested devices. Boundaries may be set based on voltages optimized for power consumption. The group of devices may be further subdivided into sub-groups based on the results of testing. The sub-groups are each assigned a unique code that reflects the results of the testing. This code is programmed into automated test equipment and is also stored in system software in order to ensure consistent values across the group of tested devices. The automated test equipment and system software are correlated using the same code to ensure higher test yield.