The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2015

Filed:

Aug. 13, 2010
Applicants:

Sachin M. Vaidya, Sunnyvale, CA (US);

Venkeepuram R. Satish, Fremont, CA (US);

Inventors:

Sachin M. Vaidya, Sunnyvale, CA (US);

Venkeepuram R. Satish, Fremont, CA (US);

Assignee:

SYMANTEC CORPORATION, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/177 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 41/0677 (2013.01); H04L 41/508 (2013.01);
Abstract

A system and method for anomaly detection and presentation. The method of anomaly detection and presentation comprises receiving information for a plurality of traits from a plurality of servers. A first server has fewer of the plurality of traits than a second server. A first trait is on fewer of the plurality of servers than a second trait. The plurality of servers is rendered in a graphical display wherein the first server is positioned to one side of the second server based on respective numbers of traits had by the first and second servers. The first trait is rendered in the graphical display to one side of the second trait based on respective numbers of systems having the first and second traits. A table may be displayed in a cell in response to a user request. Anomalous traits may be displayed in an anomaly table.


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