The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2015
Filed:
Mar. 07, 2014
Applicant:
Finisar Corporation, Sunnyvale, CA (US);
Inventor:
The' Linh Nguyen, San Jose, CA (US);
Assignee:
FINISAR CORPORATION, Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01); G01R 31/3187 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
H04L 7/0008 (2013.01); G01R 31/3187 (2013.01); G01R 31/31727 (2013.01); H04L 7/0083 (2013.01);
Abstract
In an example, a self-testing integrated circuit (IC) includes N channels i and a controller, where i is an integer from 1 to N. Each channel i may include a clock and data recovery circuit (CDR), a pseudorandom bit stream (PRBS) generator circuit, and a PRBS checker and eye quality monitor (EQM) circuit. The controller may be configured to selectively couple the channels i in a daisy chain during self-testing.
Nguyen, The'. (2015). Self-testing integrated circuits (U.S. Patent No. 9178684). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9178684
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile