The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2015
Filed:
Aug. 25, 2011
Wassim El-hassan, San Jose, CA (US);
Vishwanath Venkataraman, San Francisco, CA (US);
Wassim El-Hassan, San Jose, CA (US);
Vishwanath Venkataraman, San Francisco, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A device under test (DUT) may be tested using a test station having a test host, a non-signaling tester, and a test cell. During testing, the DUT may be placed within the test cell, and the DUT may be coupled to the test host and the tester. In one suitable arrangement, the DUT may be loaded with a predetermined test sequence. The predetermined test sequence may configure the DUT to transmit test signals using different network access technologies without synchronizing with the tester. The tester may receive corresponding test signals and perform desired radio-frequency measurements. In another suitable arrangement, the tester may be loaded with the predetermined test sequence. The predetermined test sequence may configure the tester to generate test signals using different network access technologies without establishing a protocol-compliant data link with the DUT. The DUT may receive corresponding test signals and compute receive signal quality.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile