The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2015

Filed:

Dec. 09, 2009
Applicants:

Gang Duan, Beijing, CN;

Jingtao Wu, Beijing, CN;

Xiaoyan Sun, Beijing, CN;

Dong Yang, Beijing, CN;

Inventors:

Gang Duan, Beijing, CN;

Jingtao Wu, Beijing, CN;

Xiaoyan Sun, Beijing, CN;

Dong Yang, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H02J 13/00 (2006.01); G01R 19/25 (2006.01);
U.S. Cl.
CPC ...
H02J 13/0006 (2013.01); G01R 19/2513 (2013.01); Y02E 60/728 (2013.01); Y02E 60/74 (2013.01); Y04S 10/265 (2013.01); Y04S 10/30 (2013.01);
Abstract

A state-matrix-independent dynamic process estimation method in real-time for weakly observable measurement nodes without Phasor Measurement Unit(PMU) is only dependent on real-time measurement dynamic data of measurement nodes with PMU and measurement data of Supervisory Control And Data Acquisition (SCADA) system in electric power system or state estimation data. According to the SCADA measurement data or state estimation data at some continuous moments, the method utilizes recursive least squares solution to find a linear combination relationship between variation of measurement parameter to be estimated of nodes without PMU and variation of corresponding measurement parameter of nodes with PMU. Using the linear combination of relationship, the dynamic process of measurement nodes without PMU is estimated in real-time. The method provides high estimation precision and meets error requirements of engineering application.


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