The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2015

Filed:

Jan. 18, 2011
Applicants:

Nicholas Brunelli, Atlanta, GA (US);

Konstantinos P. Giapis, Pasadena, CA (US);

Richard C. Flagan, Pasadena, CA (US);

Jesse L. Beauchamp, La Canada Flintridge, CA (US);

Evan Neidholdt, Glendale, CA (US);

Inventors:

Nicholas Brunelli, Atlanta, GA (US);

Konstantinos P. Giapis, Pasadena, CA (US);

Richard C. Flagan, Pasadena, CA (US);

Jesse L. Beauchamp, La Canada Flintridge, CA (US);

Evan Neidholdt, Glendale, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D 59/44 (2006.01); H01J 49/16 (2006.01); G01N 27/62 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
H01J 49/165 (2013.01); G01N 27/624 (2013.01); G01N 30/7233 (2013.01);
Abstract

A continuous flow mobility classifier provide the ability to perform two-dimensional separation in mass spectrometry. An ionization system is used to ionize a sample. A differential mobility analyzer (DMA) (e.g., a nano-radial DMA) is coupled to the ionization system and to a mass spectrometer. The nano-RDMA is configured to separate the ionized sample by mobility for subsequent mass analysis by the mass spectrometer.


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