The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2015
Filed:
Oct. 28, 2013
Applicant:
Sandisk Technologies Inc., Plano, TX (US);
Inventors:
Deepak Raghu, Milpitas, CA (US);
Gautam A. Dusija, Milpitas, CA (US);
Chris Avila, Saratoga, CA (US);
Yingda Dong, San Jose, CA (US);
Man Mui, Fremont, CA (US);
Xiying Costa, Milpitas, CA (US);
Pao-Ling Koh, Fremont, CA (US);
Assignee:
SanDisk Technologies Inc., Plano, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/56 (2006.01); G11C 29/00 (2006.01); G11C 16/04 (2006.01); G11C 16/10 (2006.01); G11C 29/08 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/82 (2013.01); G11C 16/0483 (2013.01); G11C 16/10 (2013.01); G11C 29/08 (2013.01); G11C 29/838 (2013.01); G11C 2029/0411 (2013.01);
Abstract
Layers in a multi-layer memory array are categorized according to likely error rates as predicted from their memory hole diameters. Data to be stored along a word line in a high risk layer is subject to a redundancy operation (e.g. XOR) with data to be stored along a word line in a low risk layer so that the risk of both being bad is low.