The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2015

Filed:

Aug. 20, 2012
Applicants:

Michael Nguyen, Norwalk, CA (US);

Robert Madison, Eastvale, CA (US);

Keith Andreasen, Garden Grove, CA (US);

Inventors:

Michael Nguyen, Norwalk, CA (US);

Robert Madison, Eastvale, CA (US);

Keith Andreasen, Garden Grove, CA (US);

Assignee:

Innova Electronics, Inc., Irvine, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G07C 5/08 (2006.01);
U.S. Cl.
CPC ...
G07C 5/0808 (2013.01); G06F 17/00 (2013.01); G07C 2205/02 (2013.01);
Abstract

There is provided a method of predicting defects likely to occur in a vehicle over a predetermined period. The method includes receiving vehicle characteristic data regarding a vehicle under consideration, and comparing the received vehicle characteristic data with a defect database. The defect database includes information related to defects that have occurred in different vehicles and the mileage at which such defects occurred. The method additionally includes identifying defects that occurred in vehicles corresponding to use vehicle under consideration, and the mileage at which such defects occurred. Detects which fail to satisfy minimum count requirements are then filtered out, and the defects are then sorted in order of the highest defect count.


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