The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2015

Filed:

Apr. 17, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Alan Valev Tonisson, Beecroft, AU;

Barry James Drake, Thornleigh, AU;

Scott Alexander Rudkin, Chatswood, AU;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/34 (2006.01); G06T 7/20 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06T 7/2033 (2013.01); G06F 17/30247 (2013.01); G06F 17/30271 (2013.01);
Abstract

A method of determining a hash code representing a portion of an image, is disclosed. A Delaunay region (e.g.,) enclosing an image feature point (e.g.,) representing at least the portion of the image is determined. The Delaunay region is determined from A* lattice points. A mapping transforming the Delaunay region to a predetermined canonical form is determined A point of the Delaunay region is received. The received point defines a plane containing the A* lattice points of the Delaunay region excluding the received point. A normal of the plane is determined by setting at least two co-ordinates of the normal to predetermined non-zero values, the two co-ordinates being selected according to the determined mapping. The hash code representing a portion of the image is determined according to a distance determined using the normal.


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