The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9177349 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 03, 2015

Filed:

Apr. 22, 2011
Applicant:

Jonathan A. Barney, Newport Beach, CA (US);

Inventor:

Jonathan A. Barney, Newport Beach, CA (US);

Assignee:

PATENTRATINGS, LLC, Newport Beach, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 99/00 (2006.01); G06Q 10/10 (2012.01); G06Q 30/02 (2012.01); G06Q 40/06 (2012.01); G06Q 50/18 (2012.01);
U.S. Cl.
CPC ...
G06Q 99/00 (2013.01); G06Q 10/10 (2013.01); G06Q 30/0202 (2013.01); G06Q 40/06 (2013.01); G06Q 50/184 (2013.01); Y10S 707/93 (2013.01); Y10S 707/99936 (2013.01); Y10S 707/99937 (2013.01);
Abstract

A statistical patent rating method and system is provided for independently assessing the relative breadth ('B'), defensibility ('D') and commercial relevance (“R”) of individual patent assets and other intangible intellectual property assets. The invention provides new and valuable information that can be used by patent valuation experts, investment advisors, economists and others to help guide future patent investment decisions, licensing programs, patent appraisals, tax valuations, transfer pricing, economic forecasting and planning, and even mediation and/or settlement of patent litigation lawsuits. In one embodiment the invention provides a statistically-based patent rating method and system whereby relative ratings or rankings are generated using a database of patent information by identifying and comparing various characteristics of each individual patent to a statistically determined distribution of the same characteristics within a given patent population. For example, a first population of patents having a known relatively high intrinsic value or quality (e.g. successfully litigated patents) is compared to a second population of patents having a known relatively low intrinsic value or quality (e.g. unsuccessfully litigated patents). Based on a statistical comparison of the two populations, certain characteristics are identified as being more prevalent or more pronounced in one population group or the other to a statistically significant degree. Multiple such statistical comparisons are used to construct and optimize a computer model or computer algorithm that can then be used to predict and/or provide statistically-accurate probabilities of a desired value or quality being present or a future event occurring, given the identified characteristics of an individual patent or group of patents.


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