The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2015
Filed:
May. 13, 2010
Jordi Mcgregor Barr, Bristol, GB;
Christopher Mark Lloyd, Bristol, GB;
Mark Lawrence Williams, Bristol, GB;
David Nicholson, Bristol, GB;
Jordi McGregor Barr, Bristol, GB;
Christopher Mark Lloyd, Bristol, GB;
Mark Lawrence Williams, Bristol, GB;
David Nicholson, Bristol, GB;
BAE SYSTEMS PLC, London, GB;
Abstract
A method and apparatus for selecting a value or change in value of a measurement variable for an observation of an object, comprising: receiving models for the object defined in terms of an observation parameter and a measurement variable; selecting values of the measurement variable; for each model, determining a value of the observation parameter for each selected value; for each selected value, determining a value of an expected classification potential level using the determined values; and selecting a value of the measurement variable dependent upon the potential level values; wherein the potential level is an expected level of: the information or lack of information, and/or the certainty or uncertainty, with which the object could be classified if a measurement of the observation parameter were taken of the object at the respective value of the measurement variable.