The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2015

Filed:

Dec. 31, 2012
Applicant:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Inventors:

Min Xu, Palo Alto, CA (US);

Sean Lie, Los Gatos, CA (US);

Gene Shen, Mountain View, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/08 (2006.01); H04L 12/801 (2013.01); H04L 1/00 (2006.01); G06F 11/10 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0724 (2013.01); G06F 11/079 (2013.01); G06F 11/08 (2013.01); G06F 11/1004 (2013.01); H04L 1/00 (2013.01); H04L 1/0061 (2013.01); H04L 43/065 (2013.01); H04L 43/0823 (2013.01); H04L 47/10 (2013.01); H04L 2001/0097 (2013.01);
Abstract

A server system performs error detection on a hop-by-hop basis at multiple compute nodes, thereby facilitating the detection of a compute node experiencing failure. The server system communicates a packet from an originating node (the originating node) to a destination node by separating the packet into multiple flow control digits (flits) and routing the flits using a series of hops over a set of intermediate nodes. The packet's final flit includes error detection information, such as checksum data. As each intermediate node receives the final flit, it performs error detection using the error detection information. The pattern of nodes that detect an error indicates which intermediate node has experienced a failure.


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