The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2015

Filed:

Apr. 11, 2013
Applicants:

Shozo Kanzaki, Chiyoda-ku, JP;

Fumiaki Arimai, Chiyoda-ku, JP;

Hiroyoshi Nishizaki, Chiyoda-ku, JP;

Inventors:

Shozo Kanzaki, Chiyoda-ku, JP;

Fumiaki Arimai, Chiyoda-ku, JP;

Hiroyoshi Nishizaki, Chiyoda-ku, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 13/04 (2006.01); G05B 19/042 (2006.01);
U.S. Cl.
CPC ...
G05B 13/041 (2013.01); G05B 19/0426 (2013.01); G05B 2219/21065 (2013.01); G05B 2219/23215 (2013.01); G05B 2219/25098 (2013.01); G05B 2219/25265 (2013.01); G05B 2219/25296 (2013.01);
Abstract

A standard characteristic which is an average characteristic of multiple samples is approximated in a polygonal-line fashion by first to third lines. The coordinate-point positions of the first and second lines at comparison adjustment points are stored as standard data in a data memory of an electronic control apparatus. An actual-product characteristic as a calibration target is approximated in a polygonal-line fashion by first to third lines. The resistance value of a label resistor is adjusted to a value corresponding to ratios of monitoring outputs. The electronic control apparatus reads the resistance values of one or two label resistors, combines them with the stored standard characteristic, and interpolates a third line portion, thereby restoring and generating the actual-product characteristic.


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