The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2015
Filed:
Apr. 18, 2013
Applicant:
The Industry & Academic Cooperation IN Chungnam National University (Iac), Daejeon, KR;
Inventors:
CheolGi Kim, Seoul, KR;
IlGyo Jeong, Daejeon, KR;
Young-Jae Eu, Daejeon, KR;
KunWoo Kim, Daejeon, KR;
XingHao Hu, Daejeon, KR;
Brajalal Sinha, Daejeon, KR;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/12 (2006.01); G01R 33/07 (2006.01); G01N 27/74 (2006.01);
U.S. Cl.
CPC ...
G01R 33/1238 (2013.01); G01N 27/745 (2013.01); G01R 33/07 (2013.01); G01R 33/1269 (2013.01);
Abstract
The present invention relates to a microfluidic chip for measuring the magnetic susceptibility of a superparamagnetic nanoparticle droplet and a method for measuring magnetic susceptibility using the same. According to the invention, the magnetic susceptibility of a superparamagnetic nanoparticle can be continuously and accurately measured in a flowing fluid using a microfluidic chip including microfluidic channels.