The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2015

Filed:

Oct. 02, 2013
Applicant:

Wistron Neweb Corp., Hsinchu, TW;

Inventors:

Chen-Hung Fang, Hsinchu, TW;

Chih-Wei Huang, Hsinchu, TW;

Wen-Jiun Lin, Hsinchu, TW;

Assignee:

WISTRON NEWEB CORP, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); H01Q 1/12 (2006.01); H01Q 1/22 (2006.01); H01Q 3/04 (2006.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01); H01Q 1/1257 (2013.01); H01Q 1/2291 (2013.01); H01Q 3/04 (2013.01);
Abstract

The present invention provides an antenna control method and an antenna device. The method includes (A) defining a plurality of rough scanning sectors in a signal region; (A) rotating the antenna to each rough scanning sector to measure a first evaluation signal; (A) selecting one of the plurality of rough scanning sectors in accordance with the first evaluation signals; (A) defining a plurality of fine scanning sectors; (A) rotating the antenna to the plurality of fine scanning sector corresponding to the selected rough scanning sector to measure a second evaluation signal; (A) selecting one of the plurality of fine scanning sectors in accordance with the second evaluation signals; (A) rotating the antenna to the selected fine scanning sector.


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